小麦条锈病新小种的不断变异和流行，给我国小麦生产造成了巨大损失。发掘成株期抗性基因并开展抗性基因聚合育种是控制条锈病最经济有效且环境友好型的最佳途径。源自国际干旱地区农业研究中心的小麦品系C33经18年连续鉴定均表现苗期轻感、成株期高度抗条锈性；病害鉴定、等位测验和分子诊断表明，C33所含成株抗性基因不同于已报道的成株抗性基因。本项目拟利用660K SNP基因芯片、DArT基因芯片及SSR标记技术，对“夏440×C33”构建的217个F7 RILs及其亲本在3年2个环境的成株期抗条锈性进行全基因组扫描，挖掘抗性QTL，明确其新颖性；利用目标区段的杂合株系构建次级分离群体，步移法加密抗性QTL的分子标记。结合表型鉴定，用获得的SNP、DArT和SSR标记对抗性基因QTL位点在不同遗传背景下的选择效率和遗传效应进行验证，为小麦条锈病持久抗性育种建立分子高效选择技术。

The variational and epidemic wheat yellow rust (YR) races caused huge losses to wheat production in China. Exploring adult plant resistance genes or pyramid resistance genes is an effective and environmental friendly way to control stripe rust disease. Common wheat C33 from International Centre for Agricultural Research in Dry Areas（ICARDA）, displays highly resistance to stripe rust during adult plant stage in past 18 years. The adult-plant resistance genes in C33 is different from those reported adult-plant resistance genes by disease identification, allelic analysis and molecular diagnostics. In this study, 217 recombinant inbred lines (RILs) derived from Xia440/C33 and two parents will be analyzed, using wheat 660K SNP array, DArT and SSR molecular technology. Fine mapping will get by primer-walking based on constrction secondary segregation population. Wheat durable resistance breeding will be established by effective molecular assisted selection.